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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

Prof Loyiso Jita appointed as UFS Dean of Education
2017-11-22

 Description: Prof Melanie Walker, Research chair into Higher Education gets boost for five more years Tags: Prof Melanie Walker, Research chair into Higher Education gets boost for five more years

Prof Loyiso Jita, UFS Dean of Education
Photo: Johan Roux

The Council of the University of the Free State (UFS) has approved the appointment of Prof Loyiso Jita as Dean of Education during its quarterly meeting held on the Bloemfontein Campus on 17 November 2017.

“Prof Jita has a strong academic background and a good understanding of the higher-education sector. I look forward to working with him and to realise the vision of the university as a research-led, student-centred and regionally engaged university that contributes to development and social justice through the production of globally competitive graduates and knowledge,” says Prof Francis Petersen, UFS Rector and Vice-Chancellor.

“It is indeed a privilege for me to lead a team of committed teachers and researchers in the faculty, providing excellent service to our undergraduate and postgraduate students. I thank the Council and executive management for their trust in me,” says Prof Jita.

In January 2017, Prof Jita was appointed as the Acting Dean of the Faculty of Education at the UFS. He will assume the position of Dean of the Faculty of Education on 1 December 2017.

Prof Jita began his career as a Science and Mathematics teacher, after graduating from Wits University in 1988. He later took up a lectureship position at the University of Zululand, where he was awarded a Fulbright scholarship to read for a PhD at Michigan State University in the USA. In the mid-1990s, he worked as a policy researcher at the University of KwaZulu-Natal where he, among others, helped to compile the submission on the Violation of Educational Rights of South Africans during apartheid, to the Truth and Reconciliation Commission (TRC).

He joined the University of Pretoria (UP) in 2001, after returning from a post-doctoral fellowship at the Northwestern University in Chicago, and was later appointed Director of the Joint Centre for Science, Mathematics and Technology Education (JCSMTE). He left the UP in 2008 for an appointment as an associate professor at the University of South Africa (Unisa), where he later became the inaugural Director of the School of Education. In 2011, he became a full professor and was appointed as the acting Deputy Executive Dean in the College of Human Sciences at Unisa.

In 2012, he joined the UFS as Research Professor in the School of Mathematics, Natural Sciences, and Technology Education. In November 2014, he was appointed as the SANRAL Chair for Science and Mathematics Education. Professor Jita has published many articles on instructional leadership, teacher development and change, Science and Mathematics education, and has presented over 50 papers at local and international conferences. He has also supervised to completion more than 37 master’s and PhD graduates, and is currently the editor-in-chief for the accredited journal, Perspectives in Education (PIE).

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