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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

UFS Council elects a new Chairperson
2009-11-22

Judge Ian van der Merwe

The Council of the University of the Free State (UFS) elected Judge Ian van der Merwe as its new Chairperson at its last meeting for this year on Friday, 20 November 2009.

Judge Van der Merwe is an alumnus of the UFS and has been a member of the Council since 9 March 2007. In accepting his appointment, Judge Van der Merwe said that he was honoured and humbled to lead a Council of this calibre. “I will always do what is in the best interest of the UFS and, together with the Council, I will work towards making it an autonomous institution of academic excellence that is non-racial, non-sexist, and where diversity is cherished,” he said.

The election of a new Chairperson and the term of the Chancellor were among the matters discussed during yesterday’s meeting.

Dr Franklin Sonn will retire as Chancellor on 31 December 2009 and the term of office of the current Chairperson of Council, Judge Faan Hancke, will also expire on 31 December 2009. Dr Sonn has been Chancellor since 7 February 2003 and Judge Hancke has been Chairperson of the Council since 1 June 2001.

“I am elated that someone of Judge Van der Merwe’s stature has been elected as Chairperson and will provide him with my full support,” said Prof. Jonathan Jansen, Rector and Vice-Chancellor.

The Council paid tribute to Judge Hancke for the time he dedicated to the UFS, as well as for his leadership, guidance and wisdom to take the institution to where it stands in the current phase of its history. The Council also recognised Judge Hancke for, amongst others, his decision to appoint Prof. Jansen as the first black Rector and Vice-Chancellor, for his role in the implementation of the Transformation Plan and the policy to increase diversity in residences at the UFS, as well as his contribution to the growth of black students.

Judge Hancke thanked the Council for their support and assistance during his term and congratulated Judge van der Merwe on his appointment. “I wish Prof. Jansen and his management team well and hope that they will have the wisdom to solve the problems the institution is facing so that they can focus on the core business of the UFS namely its academia. I know the University can make a tremendous contribution to the country,” he said.

The Council also welcomed the following new members who were present at the meeting: Mr Pule Makgoe, MEC for Education in the Free State; Mr Ndaba Ntsele, Chief Executive Officer of the Pamodzi Group and Mr Willem Louw, Managing Director of Sasol Technology.

The new Chancellor will be elected as soon as the proposed statute is approved by the Council in 2010 and published in the Government Gazette. Prof. Jansen will act as Chancellor for the interim period from 1 January 2010.

Media release
Issued by: Lacea Loader
Deputy Director: Media Liaison
Tel: 051 401 2584
Cell: 083 645 2454
E-mail: loaderl.stg@ufs.ac.za  
21 November 2009
 

 

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