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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

UFS welcomes the class of 2010
2010-01-13

Pictured with Prof Jansen are, from the left: Christo Smal (B.Sc. Quantity Surveying student from Bloemfontein), Nicole Tarentaal (LL.B. student from Bloemfontein), Charmoné Swartz (LL.B. student from Kimberley) and Lizé de Witt (B.Sc. Quantity Surveying student from Bloemfontein).
Photo: Stephen Collett


The University of the Free State (UFS) welcomed its first-time entering first-year students on the Main Campus in Bloemfontein this past weekend.

Addressing the new students and their parents at the ceremony, the Rector and Vice-Chancellor Prof. Jonathan Jansen assured the new students and their parents that “they are at the right place”.

“We will not cut corners with your child’s education as we are serious about the quality of the education we provide,” he said to the parents. “We shall make sure that our students are distinguished among graduates from other universities – that they are leaders. Quality is not negotiable.”

Prof. Jansen also said the standards of admission at the UFS would be raised. “We need students of a higher academic standard,” he said.

“Our students will obtain a degree they will be proud of. We are going to put everything into their education and experience here at the UFS so that they can be the best in their field of study.”

He told the new students and their parents that they were safe at the UFS as no first-year student would be initiated anymore. He said that there were other ways to create self-respect and confidence in a young person without having to use initiation.

“It is not enough to have a degree,” he said. “We want to link your degree to thorough preparation for the workplace. Your degree must be accepted globally.”

Prof. Jansen further emphasised the importance of students to understand one another and to get along with one another – especially with those who speak a language different from their own and with a different skin colour than theirs.

“Our students must have respect for one another. This is a value that should be added to your qualification in order for you to be relevant in the workplace anywhere in the world.”

He said the university was busy with a programme to install computer points in all the residences. He also extolled the virtues of the UFS, citing excellence in sport, music, debating and other activities.

Prof. Jansen also reiterated the fact that the first group of 100 first-year students who would be sent overseas to study during the second semester would come from this class of 2010.

“The class of 2010 will change Kovsies. They will be the best students that have ever graduated,” he said.

Media Release
Issued by: Mangaliso Radebe
Assistant Director: Media Liaison
Tel: 051 401 2828
Cell: 078 460 3320
E-mail: radebemt@ufs.ac.za  
12 January 2010
 

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