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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

High-level Texas delegation visits UFS
2010-08-13

Pictured here, from the left, back, are visitors from Texas and UFS management: Ms Stephanie Curs (Director: Office of the Vice President for Global Initiatives), Dr Edwin Price (Associate Vice-Chancellor for International Agriculture and Director of the Norman Borlaug Institute for International Agriculture), Dr Mike Greenwald (Professor and Program Director for the International Studies Program, College of Liberal Arts), Prof. Ward Wells (Professor and Associate Head for Professional Programs, College of Architecture, and Director of Academy for Visual and Performing Arts), Dr Glen Mills ( Professor and Head of Department of Architecture), and Dr Alan Sams (Executive Associate Dean, College of Agriculture and Life Sciences); front: Prof. Jonathan Jansen (Rector and Vice-Chancellor, UFS), Mr Eric Bost (former USA Ambassador to South Africa and Vice-President for Global Initiatives), and Prof. Ezekiel Moraka (Vice-Rector: External Relations, UFS). – Photo: Stephen Collett.

A high-level delegation from Texas A&M University in the USA, led by Mr Eric Bost, Vice-President Global Initiatives and previous USA Ambassador to South Africa, visited the University of the Free State (UFS) recently. The objective of the visit was to forge strategic linkages and research partnerships within the ambit of Texas A&M’s expanded Africa strategy.

Texas A&M has 50 000 students, and is internationally renowned and highly rated for its scholarship, academic achievement and excellent research profile. The delegation consisted of representatives from the President's Office, various deans and heads of departments.

The discussions during the visit identified a number of shared interests and common research foci, and colleagues were unanimous in their pursuit to strengthen the relations.

In January 2009 Mr Bost delivered his final official address as US Ambassador to South Africa on the UFS Main Campus. Mr Bost, a close friend of the UFS, has since sparked numerous activities to further the transformation agenda at the UFS, and is very supportive of the work of the International Institute for Race, Reconciliation and Social Justice. A number of Fulbright senior specialists from the US are participating in the further conceptualisation, roll-out and activities of the Institute.
 

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