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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

Examination format at UFS to change
2011-04-22

A new examination format is to be followed from the coming examination in May 2011 at the University of the Free State (UFS). According to this, the additional examination opportunity is to follow on the heels of the main examination.

According to the new format, students who qualify to write examinations will be compelled to write their papers during the first opportunity, and will only be allowed to write an additional examination once their applications for this examination have been approved. Students who qualify for re-assessment and special examinations will automatically be admitted to the additional examination and will therefore be exempt from the application process.
 
According to Dr Saretha Brüssow, Head: Teaching and Learning at the UFS, the Examination Committee requested the investigation of the double examination which applied previously, due to the pressure it caused on the university systems.
 
She said that, besides this release of pressure on systems such as the registration process, the back-to-back semester-based examination system might also lead to a possible improvement of the academic success rate, due to the shorter time span between the first and the second examination opportunities.
 
Students attended classes poorly in the past due to the second examination opportunity, which took place during the following semester after classes had resumed. “In some cases it is specifically the student at risk, who cannot afford to miss classes, who makes use of the second examination opportunity.”
 
Dr. Brüssow said the registration process was also affected by the previous format due to students who wanted to receive their results first before they registered. Other delays which occurred as a result of the second examination opportunity, were the first annual graduation ceremony which took place late in the year, the awarding of bursaries, and the finalisation of residence accommodation. Adding on to this problematic nature is students who occupy residences in the following academic year without a formal application in order to write during the second examination opportunity in January.
 
The new format is applicable to all students, except those in the Faculty of Health. Main and South Campus students can direct enquiries to addexam@ufs.ac.za. Qwaqwa Campus students should email addexam@qwa.ufs.ac.za.  Information on the new examination format is also available on www.ufs.ac.za.
 
 
Media Release
21 April 2011
Issued by: Lacea Loader
Director: Strategic Communication
Tel: 051 401 2584
Cell: 083 645 2454
E-mail: news@ufs.ac.za
 

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