Latest News Archive

Please select Category, Year, and then Month to display items
Previous Archive
18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

Inaugural lecture focuses on Plant Pathology
2005-08-16

Prof Neal Mc Laren, from the University of the Free State’s (UFS) Department of Plant Pathology, will deliver his inaugural lecture on Wednesday 17 August 2005 at 19:00 in the CR Swart Auditorium on campus.

The topic of the lecture is Beyond the pathogen:  revisited”.

Prof Mc Laren obtained his B Sc, B Sc (Hons) and M Sc (Agric) at the University of Natal and    Ph D (Plant Pathology) from the University of Pretoria.  In 1977 he was appointed as a research technician at the former Department of Agricultural Technical Services, was promoted to professional officer in 1983 and in 1995 to specialist scientist at the Agricultural Research Council.  In 2003 he was appointed as Associate Professor Extraordinary in the Department of Plant Sciences at the UFS and in 2005 as a full-time Professor of Plant Pathology. 

Prof Mc Laren has published 32 papers in accredited scientific journals or refereed proceedings which include two feature articles.  He also has three book chapters to his credit.  He has presented 35 local and 18 international conference papers and has been an invited/keynote speaker on a number of occasions.  He has published 26 popular articles, co-supervised several post-graduate students and been an examiner of a number of dissertations/theses.   He has acted as referee for numerous journal articles and was associate editor for African Plant Protection. In 1998 he received the ARC-President’s Award and in 1999, an award from the Sorghum Producers Organisation of the USA for outstanding research.

Prof Mc Laren’s principle area of interest has been diseases of sorghum with emphasis on ergot, damping-off and seedling blights, root rots and grain molds.  In addition, root rots of maize and more recently, soybean rust have received attention.  He has a particular interest in quantitative epidemiology.  

For any enquiries, please contact Ms Joan Nel at (051) 401-9301.

Media release
Issued by:  Lacea Loader
   Media Representative
   Tel:  (051) 401-2584
   Cell:  083 645 2454
   E-mail:  loaderl.stg@mail.uovs.ac.za

16 August 2005
 

We use cookies to make interactions with our websites and services easy and meaningful. To better understand how they are used, read more about the UFS cookie policy. By continuing to use this site you are giving us your consent to do this.

Accept