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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

UFS Rector gets reappointed
2007-06-08

The Council of the University of the Free State (UFS) today unanimously (Friday 8 June 2007) extended the term of Prof. Frederick Fourie, Rector and Vice-Chancellor of the UFS, for a further five years.

Prof. Fourie was appointed on 1 January 2003 in this position and his current term appointment will expire on 31 December 2007. The extension of his five-year term as Rector and Vice-Chancellor will come into effect on 1 January 2008. .

“During the course of his term Prof. Fourie clearly demonstrated that he has the competencies and abilities to manage the recent strong growth phase of the UFS and to further develop the UFS to be a modern university,” said Judge Faan Hancke, Chairperson of the UFS Council.

“His commitment to quality, integrity, justice, non-racialism and non-sexism are qualities that will be crucial to addressing the strategic objectives and priorities of the UFS,” said Judge Hancke.

According to Judge Hancke, Prof. Fourie’s confrontation of and commitment to two of the most important challenges facing the UFS also played a role in the Council’s decision to extend his term. These challenges are:

  • The institutional charter as key to successful, high-quality transformation and social robustness in the context of diversity; and
  • The strategic clusters as key to a word-class research and teaching profile, academic quality and robustness.

A diversely compiled committee with a balanced representivity made a unanimous decision to submit the extension of Prof. Fourie’s term to Council today for approval. The evaluation committee comprised of among others the chairperson of Council as the presiding officer, the vice-chairperson of Council, other Council members who are not employees of the UFS and representatives of Senate.

The process comprised of the evaluation of Prof. Fourie’s work performance and competencies within a broad framework of the strategic aims of the UFS.

According to Judge Hancke the evaluation committee considered aspects such as the staff profile of the UFS; the vision, mission, values and strategic priorities of the UFS and Prof. Fourie’s vision for the UFS; the inherent post requirements of Rector and Vice-Chancellor; the outcome of the evaluation discussion with regard to Prof. Fourie’s successes during his term as Rector and the future challenges for a rector before the recommendation was made to Council.

“On behalf of Council I wish to congratulate Prof. Fourie with his appointment and wish him all of the best with his task to take the UFS to new heights,” said Judge Hancke.

Media release
Issued by: Lacea Loader
Assistant Director: Media Liaison
Tel: 051 401 2584
Cell: 083 645 2454
E-mail: loaderl.stg@ufs.ac.za
8 June 2007
 

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