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18 March 2021 | Story Leonie Bolleurs | Photo Elfrieda Lotter
From the Centre for Microscopy are, from the left: Edward Lee, Prof Koos Terblans, Hanlie Grobler, and Nonkululeko Phili-Mgobhozi.

In its quest to inspire excellence, the University of the Free State (UFS) is in the process of installing state-of-the-art microscopy instruments that will differentiate them as leaders in materials research.

This project to the value of R65 million will not only promote research in, among others, the fields of Chemistry, Physics, Microbiology, Geology, Plant Sciences, Zoology, and Cardiothoracic Surgery, but it will also increase the number of research articles published. 

Prof Koos Terblans, Head of the Department of Physics and Director of the Centre for Microscopy at the UFS, indicates that the university recently purchased a high-resolution transmission electron microscope (HRTEM), a scanning electron microscope (SEM), and a focused ion beam secondary electron microscope. 

“The installation of the equipment that was delivered on 1 March 2021 will take approximately three to six months,” he says. 

Research at another level

The biggest instrument, the HRTEM, allows for direct imaging of the atomic structure of samples. This powerful tool will allow researchers to study the properties of materials on an atomic scale. It will, for instance, be used to study nanoparticles, semiconductors, metals, and biological material.

The instrument will also be used to optimise heat treatment of materials, as it can heat the sample up to 1000 °C while recording live images of the sample. “With this apparatus, the UFS is the only institution in South Africa that can perform this function,” says Prof Terblans. 

He says to install the apparatus, they had to dig a hole of 2 m deep in a special room where the machine was to stand. The machine was then mounted on a solid concrete block (4 m x 3 m x 2 m) in order to minimise vibration. The instrument also acquired a special air conditioner that minimises the movement of air in the room. 

The focused ion-beam secondary electron microscope that was purchased, is used together with the HRTEM, explains Prof Terblans. It is used to cut out samples on a microscopic level to place inside the HRTEM. 

Having access to both the HRTEM and the ion-beam secondary electron microscope places the UFS at another level with its research, says Prof Terblans. 

At the forefront of microscopy 

The third machine acquired, the SEM – which is an electron microscope – allows researchers to produce images of a sample by scanning the surface of the sample with a focused beam of electrons. Prof Terblans says this machine will be used to serve researchers in the biology field with high-resolution SEM photos. 

The UFS Centre for Microscopy can, besides UFS researchers, be accessed by researchers from the Central University of Technology, the national museum, and other research facilities. 

With this injection of state-of-the-art equipment, the UFS is now more than ever at the forefront of research in South Africa. 

News Archive

The book on ‘Reitz’ still not closed
2016-08-12

Description: IRSJ book  Tags: IRSJ book

Prof André Keet, Director: Institute for Reconciliation and
Social Justice (IRSJ) with the authors of Transformation
and Legitimation in Post-apartheid Universities: Reading
Discourses from ‘Reitz’,
JC van der Merwe and
Dionne van Reenen.

A new IRSJ book tackles issues of transformation.

Transformation and Legitimation in Post-apartheid Universities: Reading Discourses from ‘Reitz’ is the first in a series on critical studies in higher education transformation from the Institute for Reconciliation and Social Justice (IRSJ). In his introduction to this series, Prof André Keet, Director: Institute for Reconciliation and Social Justice (IRSJ), highlights why a scholarly work of this nature was necessary: “Acts of resistance against structurally-anchored forms of exclusion within universities in both South Africa and elsewhere suggest that, despite our best efforts, the social structure of the academy … has remained more or less intact over the past several decades.” The book was recently launched during the fifth anniversary reflections of the IRSJ.

Transformation and Legitimation in Post-apartheid Universities: Reading Discourses from ‘Reitz’ explores and expands on the landmark “Reitz” incident. The authors, JC van der Merwe, Deputy-Director at the Institute for Reconciliation and Social Justice (IRSJ) and Dionne van Reenen, researcher and PhD candidate at the IRSJ, offer insights on how this incident and the events surrounding it represent a recurring pattern that continues to underpin many processes in post-apartheid South Africa.

Prof Jonathan Jansen, Chair of the Advisory Board of the IRSJ, and Vice-Chancellor and Rector of the UFS, says of the authors: “The courage of their convictions is reflected in this book. They have played, and will continue to play, an amazing role in shaping the discourse around transformation.”

Jamie Turkington, former editor of the IRAWA Post during the time of the ‘Reitz’ incident and facilitator during the five-year anniversary function, says: “This book will be beneficial for every student and every person involved in the University of the Free State since 1980 till now to read and absorb the valuable points therein. If you thought Reitz was over, it shouldn’t be; it is as relevant today as ever.”

"If you thought Reitz was over..."

Turkington adds that the book will serve as a “worthwhile conversation starter at UFS”, raising such questions as:
• How much legitimacy was the UFS able to acquire internally, within the university community, as well as in society at large?
• How do we chart a way forward from here?
• How do we keep the progress going?

As the book itself says: “Reitz serves as a reminder to higher education practitioners that our humanity is fragile in terms of who we are and what we can achieve. Transformation and legitimation, and the way higher education institutions handle these going forward, promises to be seminal in the foreseeable future of the sector.”

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